April 22 - 26, 2024
Seattle, Washington
May 7 - 9, 2024 (Virtual)
Symposium Supporters
2024 MRS Spring Meeting
EL04.08.11

Cone-shaped defects on AlGaN quantum dots for electron-beam pumped UV-emitters

When and Where

Apr 24, 2024
5:00pm - 7:00pm
Flex Hall C, Level 2, Summit

Presenter(s)

Co-Author(s)

Lorenzo Rigutti4,Jesus Cañas1,Névine Rochat2,Adeline Grenier2,Audrey Jannaud2,ZIneb Saghi2,Jean-Luc Rouvière1,Edith Bellet-Amalric1,Anjali Harikumar1,Catherine Bougerol3,Eva Monroy1

CEA IRIG1,CEA LETI2,CNRS Institut Néel3,University of Rouen Normandie4

Abstract

Lorenzo Rigutti4,Jesus Cañas1,Névine Rochat2,Adeline Grenier2,Audrey Jannaud2,ZIneb Saghi2,Jean-Luc Rouvière1,Edith Bellet-Amalric1,Anjali Harikumar1,Catherine Bougerol3,Eva Monroy1

CEA IRIG1,CEA LETI2,CNRS Institut Néel3,University of Rouen Normandie4
One alternative to the challenges posed by AlGaN LEDs is the use of electron-beam pumped lamps based on AlGaN quantum dot (QD) superlattices (SLs). This approach offers the advantage of circumventing the challenging p-type doping and contacts of AlGaN, while providing a large active region. Previous reports from our group demonstrated UVC-emitting AlGaN QD-SLs grown by plasma-assisted molecular beam epitaxy with internal quantum efficiency in the range of 50% [1]. However, the samples still exhibit spatial inhomogeneities and relatively wide (between ~10 and ~20 nm ) emission lines, sometimes with multi-peak structure. In this contribution, we delve into the origin of bimodal emission in AlGaN/AlN QD superlattices in the 230-300 nm spectral range. The secondary emission at longer wavelengths is linked to the presence of cone-shaped defects originating at the AlN buffer/superlattice interface and propagating vertically. These defects are associated with a dislocation that produces strong shear strain, which favors the formation of 30° faceted pits. The cone-like structures present Ga enrichment at the boundary facets and larger QDs within the defect. The bimodality is attributed to the differing QD size/composition within the defects and at the defect boundaries, which is confirmed by the correlation of microscopy results and Schrödinger-Poisson calculations [2].<br/>[1] J. Cañas et al., under review. arXiv:2305.15825 <b>2023</b>. https://doi.org/10.48550/arXiv.2305.15825<br/>[2] J. Cañas et al., under review. arXiv:2310.04201 <b>2023</b>. https://doi.org/10.48550/arXiv.2310.04201

Keywords

defects | nitride

Symposium Organizers

Hideki Hirayama, RIKEN
Robert Kaplar, Sandia National Laboratories
Sriram Krishnamoorthy, University of California, Santa Barbara
Matteo Meneghini, University of Padova

Symposium Support

Silver
Taiyo Nippon Sanso

Session Chairs

Robert Kaplar
Sriram Krishnamoorthy

In this Session