December 1 - 6, 2024
Boston, Massachusetts
Symposium Supporters
2024 MRS Fall Meeting & Exhibit
NM05.01.06

Phase Transition in Two-Dimensional Monolayer (1L)-Molybdenum Disulfide Via Synchrotron X-Ray Monochromatic Beam Radiation for Superior Electronic Performance

When and Where

Dec 1, 2024
9:15am - 9:30am
Hynes, Level 2, Room 207

Presenter(s)

Co-Author(s)

Mayur Chaudhary1,Aswin Anbalagan2,Peter Sushko3,Li-Chyong Chen4,Kuei-Hsien Chen4,Ya-Ping Chiu5,Yu-Lun Chueh1

National Tsing Hua University1,Brookhaven National Laboratory2,Pacific Northwest National Laboratory3,National Taiwan University4,Academia Sinica5

Abstract

Mayur Chaudhary1,Aswin Anbalagan2,Peter Sushko3,Li-Chyong Chen4,Kuei-Hsien Chen4,Ya-Ping Chiu5,Yu-Lun Chueh1

National Tsing Hua University1,Brookhaven National Laboratory2,Pacific Northwest National Laboratory3,National Taiwan University4,Academia Sinica5
Here, we report a novel approach to reduce the channel resistance by inducing a phase transition behavior from 2H to 1T in a monolayer MoS<sub>2</sub> (1L-MoS<sub>2</sub>) by a synchrotron X-ray monochromatic beam (moon-beam) radiation. The effects of the biphase structure by the mono-beam on the 1L-MoS<sub>2</sub> film were investigated using Raman spectra, photoluminescence (PL) spectra, scanning tunneling microscopy, and scanning tunneling spectroscopy, respectively. Through material characterization, we identified that the lateral sliding of S-vacancies along the S-plane in the 1L-MoS<sub>2</sub> is the key reason for the origin of unidirectional phase transition. The precise phase engineering triggered by the mono-beam radiation process allows the realization of field-effect transistors (FET) with 2X improvement in mobility toward a high on/off ratio (~10<sup>8</sup>) and a near-ideal subthreshold swing of ~88 mV per decade. The validity of the phase engineering could be further extended for its application as a memory device, exhibiting a gate tunable conduction modulation behavior and a high resistance ratio of ~10<sup>2</sup> at a gate bias of 5 V with endurance of ~100 cycles. Furthermore, an artificial neural network using the synaptic weight update with accuracy of ~93 % was achieved.

Keywords

scanning tunneling microscopy (STM)

Symposium Organizers

Andras Kis, Ecole Polytechnique Federale de Lausanne
Li Lain-Jong, University of Hong Kong
Ying Wang, University of Wisconsin, Madison
Hanyu Zhu, Rice University

Session Chairs

Zhiyuan Zeng
Hanyu Zhu

In this Session