December 1 - 6, 2024
Boston, Massachusetts

Event Supporters

2024 MRS Fall Meeting & Exhibit
CH06.09.04

Capturing Rayleigh-Plateau Instability in Silver Nanowires via Ultrafast Electron Microscopy

When and Where

Dec 4, 2024
8:00pm - 10:00pm
Hynes, Level 1, Hall A

Presenter(s)

Co-Author(s)

Shuai Jiang1,Volkan Ortalan1

University of Connecticut1

Abstract

Shuai Jiang1,Volkan Ortalan1

University of Connecticut1
In recent years, the development of ultrafast transmission electron microscopy (UTEM) has allowed us to observe ultrafast processes occurring in materials, contributing to a fundamental understanding of a wide range of dynamic processes. In UTEM, while samples are excited with a pulsed laser to trigger reactions, a second delayed laser pulse is used to stimulate the photoemission of an electron pulse from the cathode. Depending on the reversibility of the studied dynamics, UTEM can be operated either in stroboscopic<sup>1</sup> or single-shot mode<sup>2</sup>. In this presentation, the application of single-shot UTEM in probing irreversible dynamics of materials will be exemplified for the Plateau-Rayleigh instability behavior of silver nanowires upon laser irradiation. By comparing the laser fluence required to initiate the Plateau-Rayleigh instability in silver nanowires on different substrates, it was found that substrate heating was the main driving force for the Plateau-Rayleigh instability in this study. In addition, the complex motions of silver nanowires under laser irradiation were systematically investigated by combining the results of UTEM with scanning electron microscopy characterizations. They were determined to be related to nanowire-membrane interactions or pre-existing stresses on the nanowires, demonstrating the potential of single-shot UTEM for the characterization of materials under extreme conditions<sup>3</sup>.<br/><br/>References<br/><br/>1. Zewail, A. H. Four-Dimensional Electron Microscopy. <i>Science</i> <b>328</b>, 187–193 (2010).<br/>2. LaGrange, T. <i>et al.</i> Single-shot dynamic transmission electron microscopy. <i>Applied Physics Letters</i> <b>89</b>, 044105 (2006).<br/>3. Jiang, S. & Ortalan, V. Capturing Plateau-Rayleigh instability in silver nanowires via ultrafast electron microscopy. <i>Nano Research</i> (2024) doi:10.1007/s12274-024-6770-7.

Keywords

transmission electron microscopy (TEM)

Symposium Organizers

Omar F. Mohammed, KAUST
Libai Huang, Purdue University
Volkan Ortalan, University of Connecticut
Ding-Shyue (Jerry) Yang, University of Houston

Session Chairs

Omar F. Mohammed
Libai Huang
Volkan Ortalan
Ding-Shyue (Jerry) Yang

In this Session