Dec 4, 2024
8:00pm - 10:00pm
Hynes, Level 1, Hall A
Abasi Abudulimu1,Sheng Fu1,Nadeesha Katakumbura1,Nannan Sun1,Steven Carter1,Lei Chen1,Manoj Rajakaruna1,Jared Friedl1,Tyler Brau1,Zhaoning Song1,Adam Phillips1,Michael Heben1,Yanfa Yan1,Randy Ellingson1
The University of Toledo1
Abasi Abudulimu1,Sheng Fu1,Nadeesha Katakumbura1,Nannan Sun1,Steven Carter1,Lei Chen1,Manoj Rajakaruna1,Jared Friedl1,Tyler Brau1,Zhaoning Song1,Adam Phillips1,Michael Heben1,Yanfa Yan1,Randy Ellingson1
The University of Toledo1
Tin-lead (Sn-Pb) perovskite solar cells are at the forefront of photovoltaic research, offering an exciting balance of high efficiency and reduced environmental impact. Despite their promising attributes, the optimization of Sn-Pb perovskites has been hindered by inconsistent reports of carrier lifetimes, crucial for device performance. Our comprehensive study tackles these inconsistencies head-on by integrating state-of-the-art transient photovoltage (TPV) and transient photocurrent (TPC) techniques, along with time-resolved photoluminescence (TRPL) measurements under diverse operational conditions. Enhanced by rigorous simulation and analytical methods, our research provides novel insights:<br/><b>1. Elucidation of Trap-Assisted Recombination Mechanisms:</b> Dominant under low-light conditions, this finding is crucial for understanding device performance under real-world lighting.<br/><b>2. Quantification of the Radiative Recombination Coefficient:</b> Dominant at high illumination levels, it can influence the design of high-efficiency solar cells.<br/><b>3. Effective Carrier Lifetimes:</b> Specifically under standard 1 sun illumination, offering a realistic perspective on device operation.<br/><b>4. Correlation Between TPV and TRPL Data:</b> This establishes a robust methodological framework for predicting device performance.<br/><b>5. Validation and Reproduction of Open-Circuit Voltages:</b> confirms the accuracy of TPV-derived parameters, reinforcing the reliability of our measurements and data analysis.<br/><b>6. Impact of Device Degradation on Carrier Lifetime:</b> We identify the significant effects of device stability (during the measurement) on data integrity, underscoring the importance of robust testing environments.<br/><br/>Our findings not only clarify the previously reported discrepancies in carrier lifetime data but also provide a deeper understanding of the intrinsic carrier dynamics within Sn-Pb perovskites. By addressing both fundamental science and practical challenges, this work sets the stage for next-generation solar cells that combine enhanced performance with increased reliability, marking a significant stride toward sustainable energy solutions.