Surface Properties of Two-Dimensional Materials with In-Depth Nano Surface Characterization

Low-dimensional materials are evolving fast as nanofillers in lightweight structural materials and electronic and sensing applications. Their low cost, scalability, and wide availability of surface functional groups improve composite interfacial mechanics, conductivity, and mechanical performance. Here, we show the use of multimode atomic force microscopy (AFM) to comprehensively characterize two-dimensional (2D) material surface phenomena. From Ti₃C₂T_x MXene nanoflakes and graphene oxide, thin layers via Langmuir Blodgett deposition. We compare the chemical surface modification of these 2D flakes for tunable surface interactions. We have used various AFM techniques, including topography, quantitative nanomechanical measurement (QNM), Kelvin-Probe microscopy (KPFM) and Nano-IR AFM. These quantitatively illustrate the mechanical, electrical, and chemical disparities between and within 2D flakes. Fundamentally describing heterogeneous nanoscale surface properties and distinguishing between individual flakes allows for a multifaceted understanding of interface performance within complex composites and heterostructure arrangements.