December 1 - 6, 2024
Boston, Massachusetts

Event Supporters

2024 MRS Fall Meeting & Exhibit
CH04.11.02

Towards Operando Secondary Ion Mass Spectrometry Imaging of Lithium Redistribution in Solid-State Lithium-Ion Batteries—Correlation of Structural, Chemical and Electrochemical Characteristics

When and Where

Dec 4, 2024
3:45pm - 4:00pm
Sheraton, Third Floor, Commonwealth

Presenter(s)

Co-Author(s)

Santhana Eswara1,Sayantan Sharma1,Tom Wirtz1

Luxembourg Institute of Science and Technology1

Abstract

Santhana Eswara1,Sayantan Sharma1,Tom Wirtz1

Luxembourg Institute of Science and Technology1
Innovations in lithium-ion batteries rely crucially on the availability of advanced characterization techniques. High-resolution chemical imaging of low-Z elements e.g., lithium (Li) is often difficult in many conventional chemical analysis techniques such as Energy-Dispersive X-ray Spectroscopy. High-resolution Secondary Ion Mass Spectrometry (SIMS) imaging is a well-known technique for the analysis of all elements including isotopes. For this reason, SIMS imaging is used in numerous studies related to Li-ion battery research. While direct imaging of Li in post-mortem battery components is helpful to understand parts of the degradation mechanisms, a complete dynamic view of the evolution of the Li distribution at high resolution during operation (‘<i>operando</i>’) of batteries is required to fully understand the local interfacial processes, charge transport characteristics and the degradation mechanisms. A few reports presenting <i>operando</i> Time-of-Flight SIMS imaging of batteries have recently been published [1], but the lateral resolution demonstrated in these reports is not adequate to study local processes that occur at nanoscale.<br/><br/>In order to demonstrate <i>operando</i> SIMS chemical imaging with sub-20 nm lateral resolution, we developed a novel <i>operando</i> methodology suitable for Focused Ion Beam (FIB)-SIMS imaging and analysis. An in-house designed magnetic-sector mass spectrometer [2] attached to a ThermoFisher SCIOS Ga<sup>+</sup> FIB is used for SIMS chemical imaging. A special <i>operando</i> sample holder was designed to enable electrochemical cycling of batteries within the FIB-SIMS instrument. The micromanipulator inside the FIB (typically used for preparing thin lamellae for Transmission Electron Microscopy) is used to contact one of the battery electrodes through the <i>operando</i> sample holder and complete the electrical circuit. An external potentiostat is then connected to the instrument to drive the charging/discharging of batteries. The proof-of-concept experiments were performed using Li|Li<sub>7</sub>La<sub>3</sub>Zr<sub>2</sub>O<sub>12</sub>|Li symmetric half-cells. Galvanostatic cycling was performed <i>in-situ</i> inside the FIB-SIMS instrument until the sample failed. SIMS chemical mapping revealed a redistribution of Li during cycling. Lithium rich phases appeared during cycling which likely percolated through grain-boundaries and pores of the solid electrolyte causing a short-circuit failure. These results validate our methodology for <i>operando</i> analysis of Li-ion batteries with the possibility to obtain SIMS chemical images with sub-20 nm lateral resolution [3, 4].<br/><br/>This work was funded by Horizon Europe project OPINCHARGE and by the Luxembourg National Research Fund (FNR) through the grant INTER/MERA/20/13992061 (INTERBATT).<br/><br/>[1] Y. Yamagishi et al., <i>J. Phys. </i><i>Chem. Lett.</i> 2021, 12, 19, 4623–4627<br/>[2] O. De Castro et al., <i>Analytical Chemistry,</i> 2022, 94, 30, 10754–10763.<br/>[3] L. Cressa et al., <i>Analytical Chemistry, 2023, </i>95, 9932–9939<br/>[4] L. Cressa et al., Electrochimica Acta 494 (2024) 144397

Keywords

focused ion beam (FIB) | operando | secondary ion mass spectroscopy (SIMS)

Symposium Organizers

Rachel Carter, U.S. Naval Research Laboratory
David Halat, Lawrence Berkeley National Laboratory
Mengya Li, Oak Ridge National Laboratory
Duhan Zhang, Massachusetts Institute of Technology

Symposium Support

Bronze
Nextron Corporation

Session Chairs

David Halat
Duhan Zhang

In this Session