Recent Advances in Magnetic-Field-Free Atomic-Resolution Transmission Electron Microscopy

Magnetic-field-free environment for samples is indispensable for characterizing magnetic materials and devices at very high spatial resolution by transmission electron microscopy. Recently developed magnetic objective lens system that realizes a magnetic field free environment at the sample position has realized atomic-resolution observation of magnetic materials [1,2]. This magnetic-field-free atomic-resolution electron microscope (MARS) will be a powerful tool for characterizing many magnetic materials and spintronics devices. In this talk, recent developments and applications of MARS with related new techniques such as tilt-scan differential phase contrast imaging technique [3,4] will be reported.<br/><br/><br/>[1] N. Shibata et al., <i>Nature Comm.</i> 10, 2380 (2019).<br/>[2] T. Seki et al., <i>Nature Comm.</i> 14, 7806 (2023).<br/>[3] S. Toyama et al., <i>Nature Nanotech.</i>, 18, 521-528 (2023).<br/>[4] S. Toyama et al., <i>submitted</i>.<br/>[5]This work is supported by JST ERATO grant number JPMJER2202 and the JSPS KAKENHI (grant number 20H05659).