Digital Laboratory with Modular Measurement System and Standardized Data Format for Thin-Film Materials Exploration

To accelerate materials exploration, machine learning, robotics, and data-driven experiments are underway worldwide. ^[1-5] In this study, we constructed a digital laboratory to collect experimental data on the synthesis process, measured properties, analytical results, and measurement conditions for studying solid-state thin-film materials. The features of the digital laboratory are summarized as follows:<br/>1. Each modular experimental device is physically connected, enabling fully automated processes from thin-film material synthesis to surface structure observation, compositional analysis, crystal structure evaluation, electrical conductivity, and optical property measurements.<br/>2. Data output from each measurement device is unified in XML format (MaiML: Measurement, Analysis, Instrument Markup Language ^[6]) and collected in a cloud-based database. Additionally, the data is analyzed and utilized by software in the cloud.<br/>3. Through machine learning and robots can autonomously conduct material discovery.<br/>We have previously reported the digital laboratory on the hardware.^_[7] In this presentation, we will explain the overall system configuration related to software, including data format collection in MaiML, a common data format of the Japanese Industrial Standards (JIS).<br/><br/><br/>References<br/>1. R. Shimizu, T. Hitosugi <i>et al</i>., APL Mater. 2020, <b>8</b>, 111110.<br/>2. S. Kobayashi, T. Hitosugi <i>et al</i>. ACS Materials Lett. 2023, <b>5</b>, 2711-2717.<br/>3. N. Ishizuki, T. Hitosugi <i>et al.</i>, STAM Methods, 2023, <b>3</b>, 2197519.<br/>4. R. Nakayama, T. Hitosugi <i>et al</i>., STAM Methods, 2022, <b>2</b>, 119-128.<br/>5. H. Xu, T. Hitosugi <i>et al</i>., STAM Methods, 2023, <b>3</b>, 2210251.<br/>6. S. Ichimura, J. Surf. Anal. 2019, <b>26</b>, 92-93.<br/>7. K. Nishio, T. Hitosugi <i>et al</i>., 2023 MRS Fall Meeting, DS01, 12^th Nov.