December 1 - 6, 2024
Boston, Massachusetts

Event Supporters

2024 MRS Fall Meeting & Exhibit
CH05.13.01

In-Situ Investigation on Reversible Polar-to-Nonpolar Phase Transition in Fluorite Oxide Ferroelectrics

When and Where

Dec 4, 2024
8:00pm - 10:00pm
Hynes, Level 1, Hall A

Presenter(s)

Co-Author(s)

Xinyan Li1,2,Qinghua Zhang2,Chen Ge2,Lin Gu3,Yimo Han1,Ramamoorthy Ramesh1

Rice University1,Chinese Academy of Sciences2,Tsinghua University3

Abstract

Xinyan Li1,2,Qinghua Zhang2,Chen Ge2,Lin Gu3,Yimo Han1,Ramamoorthy Ramesh1

Rice University1,Chinese Academy of Sciences2,Tsinghua University3
Switchable spontaneous polarization of ferroelectrics enables stable storage of two reversible polarization states applicable to next-generation electronic devices. As exemplified by Hf<sub>x</sub>Zr<sub>1-x</sub>O<sub>2</sub> (HZO), fluorite oxide thin films demonstrate great silicon compatibility and robust FE polarization down to the thickness of several unit cells, which is beneficial for silicon-compatible and scalable electronics. However, fluorite oxides exhibit various polymorphs and the desirable ferroelectric orthorhombic (O) phases is metastable. Therefore, stabilizing O phase instead of nonpolar ground-state monoclinic (M) phase in thin films remains a significant challenge [1] and understanding the mechanisms that govern phase transitions and FE switching at the atomic scale [2] is crucial for rational design of fluorite oxide devices.<br/><br/>In this study, we investigate the reversibility of O-M phase transition in ZrO<sub>2</sub> nanocrystals by <i>in-situ</i> visualization of the martensitic transformation at atomic scale. We reveal that the reversible shear deformation pathway from O phase to M state is protected by 90° ferroelectric-ferroelastic switching. Nevertheless, as the M state gradually accumulates localized strain, a critical tensile strain can pin the ferroelastic domain, resulting in an irreversible O-to-M transformation and the loss of ferroelectricity. Additionally, four-dimensional scanning transmission electron microscopy (4D-STEM) analysis shed light on the crystal relationship in the thin film on a larger scale [3]. These findings demonstrate the key role of ferroelastic switching in the reversibility of phase transition, and also provide a tensile-strain threshold for stabilizing the metastable ferroelectric phase in fluorite-oxide thin films.<br/><br/><b>References:</b><br/>1. X. Li, <i>et al</i>., <i>Nat</i><i>.</i><i> Mater</i><i>.</i>, 2024. DOI: 10.1038/s41563-024-01853-9.<br/>2. X. Li, <i>et al</i>., <i>Adv.</i><i> Mater</i><i>.</i>, <b>35</b>, 2207736, 2023.<br/>3. Shi C, <i>et al</i>., <i>Nat. Commun.</i>, <b>14</b>, 7168, 2023.

Keywords

in situ | transmission electron microscopy (TEM)

Symposium Organizers

Miaofang Chi, Oak Ridge National Laboratory
Ryo Ishikawa, The University of Tokyo
Robert Klie, University of Illinois at Chicago
Quentin Ramasse, SuperSTEM Laboratory

Symposium Support

Bronze
EKSPLA 
Protochips
Thermo Fisher Scientific, Inc.

Session Chairs

Miaofang Chi
Quentin Ramasse

In this Session