Dec 3, 2024
8:30am - 9:00am
Sheraton, Third Floor, Hampton
Peter Muller-Buschbaum1
Technische Universität München1
Thin film devices are complicated functional stacks that combine layers of different material classes, such as oxides, polymers, and metals. In many cases, different thin film deposition methods are required to build-up the entire functional stack. Any mistake in one of these multiple layers will lower the device efficiency or even cause a device failure. Therefore, a detailed understanding of the different thin film deposition processes is mandatory.<br/>With advanced in situ scattering studies at synchrotron radiation facilities, the complicated underlying film formation processes can be deciphered. Thin film processing is followed with a very high temporal and spatial resolution due to the available small-sized beams and high beam brilliance. In particular, with in situ grazing incidence small- and wide-angle X-ray scattering (GISAXS and GIWAXS) studies, we gain information on the kinetics of inner structures forming during thin film processing. The crystalline structure is probed with GIWAXS and the mesoscale structure is determined with GISAXS. From these data, models about the morphology evolution are extracted and these models guide the fundamental understanding to increase reproducibility in the device fabrication. Here, we focus on the solar cell fabrication of organic and perovskite solar cells, which are both exciting next-generation solar cell types. In particular, we compare examples from thin film deposition via printing [1], spin coating [2], spray coating [3], and sputter deposition [4].<br/><br/><br/>[1] Adv. Opt. Mater. <b>12</b>, 2301008 (2024)<br/>[2] Nat. Commun. <b>12</b>, 5624 (2021)<br/>[3] ACS Appl. Nano Mater. <b>1</b>, 4227-4235 (2018)<br/>[4] ACS Appl. Mater. Interfaces <b>12</b>, 46942-46952 (2020)