Dec 5, 2024
8:00pm - 10:00pm
Hynes, Level 1, Hall A
Jung-Min Cho1,Gil-Sung Kim1,No-Won Park1,Min-Sung Kang1,Jae Won Choi1,Yun-Ho Kim1,Gangmin Park1,Sang-Kwon Lee1
Chung-Ang University1
Jung-Min Cho1,Gil-Sung Kim1,No-Won Park1,Min-Sung Kang1,Jae Won Choi1,Yun-Ho Kim1,Gangmin Park1,Sang-Kwon Lee1
Chung-Ang University1
Two-dimensional (2D) transition metal dichalcogenide (TMDC) thin films are attracting significant attention as next-generation materials due to their tunable energy band gaps. In particular, 2D PtSe<sub>2</sub> thin films are excellent materials that can adjust their energy band gaps based on thickness. Additionally, a non-ideal thermoelectric effect has been discovered in stacked structures of 2D TMDC thin films. Typically, the Seebeck effect according to thickness is expressed as a parallel conductor model. However, in the case of vertically stacked 2D PtSe<sub>2</sub> thin films, a non-ideal Seebeck effect has been observed. Our research reports that vertically stacked PtSe<sub>2</sub> thin films exhibit an improved Seebeck coefficient compared to 1-stacked PtSe<sub>2</sub> films due to interfacial effects. This enhancement is attributed to the interaction of hot carriers with the interface, which results in properties independent of the general Seebeck coefficient. Measurements using self-manufactured thermoelectric performance equipment (CAU-system, CAU-SYS) show that the Seebeck coefficient increased by approximately 261% in 4-stacked PtSe<sub>2</sub> samples compared to 1-stacked PtSe<sub>2</sub> samples. Additionally, the power factor increased dramatically by about 570% in 5-stacked PtSe<sub>2</sub> samples. Furthermore, temperature-dependent measurements using Quantum Design's physical properties measurement system (PPMS) demonstrate that this phenomenon remains stable even at low temperatures. The decrease in Seebeck coefficient, electrical conductivity, and power factor with decreasing temperature can be explained by the temperature-dependent electronic behavior of p-type PtSe<sub>2</sub> semiconductors. To calculate the figure of merit (ZT), thermal conductivity measurements are being conducted using the heat diffusion imaging method. This research highlights the dramatic improvement in thermoelectric performance due to the interface-induced Seebeck effect in vertically stacked structures. Therefore, it is anticipated that semiconductor and thermoelectric research using stacked structure technology will be actively pursued in the future.