Customization of an Atomic Force Microscope for Multidimensional Measurements

Atomic force microscopy (AFM) is an analytical surface characterization tool that reveals the surface topography at a nanometer-length scale while probing local sample properties. Advanced imaging techniques, such as frequency modulation, to achieve high resolution and quantitative surface properties are not implemented in many commercial systems. In this presentation, we illustrate the step-by-step customization of a commercial atomic force microscope [1]. The original instrument was capable of surface topography and basic force spectroscopy measurements while employing environmental control, such as temperature variation of the sample/tip, etc. We demonstrate the capabilities of the customized system with (automated) frequency modulation-based experiments, <i>e.g.</i>, voltage and/or distance spectroscopy [2], time-resolved AFM, and two-dimensional force spectroscopy measurements under ambient conditions. We also illustrate the enhanced stability of the setup with active topography and frequency drift corrections. We think that our methodology can be useful for the customization and automation of other scanning probe systems.<br/>[1] Bugrahan Guner, Simon Laflamme, and <b>Omur E. Dagdeviren</b>, Review of Scientific Instruments <b>94</b> (6) (2023).<br/>[2] Bugrahan Guner and <b>Omur E. Dagdeviren</b>, ACS Applied Electronic Materials <b>4</b> (8), 4085 (2022).<br/><br/>Funding information:<br/>This work was supported by the Canada Economic Development Fund, Natural Sciences and Engineering Research Council of Canada, and Le Fonds de Recherche du Québec - Nature et Technologies.