April 10 - 14, 2023
San Francisco, California
2023 MRS Spring Meeting
EL19.10.21
Understanding Oxygen Migration due to Contacts and Gate Bias-Stress in Indium Tin Oxide Transistors
When and Where
Apr 13, 2023
5:00pm - 7:00pm
5:00pm - 7:00pm
Moscone West, Level 1, Exhibit Hall
Presenter(s)
Co-Author(s)
Sumaiya Wahid1,Mahnaz Islam1,Christopher Perez1,Timothy Brown2,Michelle Chen1,Matthew Marcus3,Hendrik Ohldag3,Suhas Kumar2,Eric Pop1
Stanford University1,Sandia National Laboratories2,Lawrence Berkeley National Laboratory3
Keywords
electrical properties | oxide | spectroscopy
Symposium Organizers
Paul Berger, The Ohio State University
Supratik Guha, The University of Chicago
Francesca Iacopi, University of Technology Sydney
Pei-Wen Li, National Yang Ming Chiao Tung University
Symposium Support
Gold
IEEE Electron Devices Society
IEEE Electron Devices Society
Session Chairs
Paul Berger
Pei-Wen Li