Defect Quantification of MOCVD Deposited Monolayer MoS₂ Using Kelvin Probe Force Microscopy Technique

Apr 25, 2023
11:50am - 11:55am

EL18-virtual

Moha Feroz Hossen^1,2,Olubukola Ayanbajo^1,2,Sachin Shendokar^1,2,Swapnil Nalawade^1,2,Shyam Aravamudhan^1,2

Joint School of Nanoscience and Nanoengineering¹,North Carolina A&T State University²

2D materials | defects

Ho-Hsiu Chou, National Tsing Hua University

Francisco Molina-Lopez, KU Leuven

Sihong Wang, University of Chicago

Xuzhou Yan, Shanghai Jiao Tong University

Bronze
Azalea Vision
MilliporeSigma
Device, Cell Press

Sihong Wang

Xuzhou Yan

Defect Quantification of MOCVD Deposited Monolayer MoS2 Using Kelvin Probe Force Microscopy Technique