Atomic Scale Imaging of Li Vacancies in a Li-Ion Battery Cathode Material via Multislice Electron Ptychography

Apr 12, 2023
11:00am - 11:15am

InterContinental, Fifth Floor, Ballroom C

Dasol Yoon

Yao Yang

Dong Ren

David Muller

Dasol Yoon¹,Yao Yang¹,Dong Ren¹,Hector Abruna¹,David Muller¹

Cornell University¹

defects | scanning transmission electron microscopy (STEM)

Rosa Arrigo, University of Salford

Qiong Cai, University of Surrey

Akihiro Kushima, University of Central Florida

Junjie Niu, University of Wisconsin--Milwaukee

Bronze
Gamry Instruments
IOP Publishing
Protochips Inc
Thermo Fisher Scientific

Junjie Niu

Verena Streibel