April 10 - 14, 2023
San Francisco, California
2023 MRS Spring Meeting
CH01.06.01
Two Microscopes Are Better Than One – A Unique New Inspection Tool For Advanced Characterization by In Situ Combination of AFM and SEM
When and Where
Apr 12, 2023
8:15am - 8:30am
8:15am - 8:30am
InterContinental, Fifth Floor, Ballroom C
Presenter(s)
Co-Author(s)
Sebastian Seibert1,Hajo Frerichs1,Lukas Stuehn1,Marion Wolff1,Christian Schwalb1
Quantum Design Microscopy GmbH1
Keywords
in situ | scanning electron microscopy (SEM) | scanning probe microscopy (SPM)
Symposium Organizers
Rosa Arrigo, University of Salford
Qiong Cai, University of Surrey
Akihiro Kushima, University of Central Florida
Junjie Niu, University of Wisconsin--Milwaukee
Symposium Support
Bronze
Gamry Instruments
IOP Publishing
Protochips Inc
Thermo Fisher Scientific
Gamry Instruments
IOP Publishing
Protochips Inc
Thermo Fisher Scientific
Session Chairs
Junjie Niu
Verena Streibel