April 10 - 14, 2023
San Francisco, California
2023 MRS Spring Meeting & Exhibit
CH01.12.07
High Throughput Characterization Methods at the Wafer Scale for Sputtered Films Used in Micro-Supercapacitors and Li-Ion Micro-Batteries
When and Where
Apr 14, 2023
10:30am - 10:45am
10:30am - 10:45am
InterContinental, Fifth Floor, Ballroom C
Presenter(s)
Co-Author(s)
Pascal Roussel1,Aiman Jrondi1,2,Khac Huy Dinh2,1,Bukola Jolayemi2,Maxime Hallot2,Clément Leviel1,2,Christophe Lethien2,3
UCCS - CNRS UMR81811,IEMN - CNRS UMR 85202,Institut Universitaire de France3
Keywords
combinatorial | x-ray diffraction (XRD)
Symposium Organizers
Rosa Arrigo, University of Salford
Qiong Cai, University of Surrey
Akihiro Kushima, University of Central Florida
Junjie Niu, University of Wisconsin--Milwaukee
Symposium Support
Bronze
Gamry Instruments
IOP Publishing
Protochips Inc
Thermo Fisher Scientific
Gamry Instruments
IOP Publishing
Protochips Inc
Thermo Fisher Scientific
Session Chairs
Rosa Arrigo
Junjie Niu