April 10 - 14, 2023
San Francisco, California
2023 MRS Spring Meeting
CH01.12.07

High Throughput Characterization Methods at the Wafer Scale for Sputtered Films Used in Micro-Supercapacitors and Li-Ion Micro-Batteries

When and Where

Apr 14, 2023
10:30am - 10:45am
InterContinental, Fifth Floor, Ballroom C

Presenter(s)

Co-Author(s)

Pascal Roussel1,Aiman Jrondi1,2,Khac Huy Dinh2,1,Bukola Jolayemi2,Maxime Hallot2,Clément Leviel1,2,Christophe Lethien2,3

UCCS - CNRS UMR81811,IEMN - CNRS UMR 85202,Institut Universitaire de France3

Keywords

combinatorial | x-ray diffraction (XRD)

Symposium Organizers

Rosa Arrigo, University of Salford
Qiong Cai, University of Surrey
Akihiro Kushima, University of Central Florida
Junjie Niu, University of Wisconsin--Milwaukee

Symposium Support

Bronze
Gamry Instruments
IOP Publishing
Protochips Inc
Thermo Fisher Scientific

Session Chairs

Rosa Arrigo
Junjie Niu

In this Session