April 10 - 14, 2023
San Francisco, California
2023 MRS Spring Meeting
QM04.05.01
Direct Imaging of Charge Distribution at Crystalline Defects by Scanning Transmission Electron Microscopy
When and Where
Apr 12, 2023
8:00am - 8:30am
8:00am - 8:30am
Marriott Marquis, Fourth Level, Pacific E
Presenter(s)
Naoya Shibata, The University of Tokyo
Co-Author(s)
Naoya Shibata1,2
The University of Tokyo1,Japan Fine Ceramics Center2
Keywords
grain boundaries | interface | scanning transmission electron microscopy (STEM)
Symposium Organizers
Albina Borisevich, Oak Ridge National Laboratory
Rohan Mishra, Washington University in St. Louis
Jayakanth Ravichandran, University of Southern California
Han Wang, Taiwan Semiconductor Manufacturing Company North America
Symposium Support
Bronze
JEOL USA, INC.
JEOL USA, INC.
Session Chairs
Berit Goodge
Petro Maksymovych