November 26 - December 1, 2023
Boston, Massachusetts
Symposium Supporters
2023 MRS Fall Meeting & Exhibit
CH01.13.24

Laser-Based Measurements Meet or Exceed Electron Microscopy in The Detection of Surface Damage

When and Where

Nov 29, 2023
8:00pm - 10:00pm
Hynes, Level 1, Hall A

Presenter(s)

Co-Author(s)

Thomas Pfeifer1,Eric Hoglund2,1,Patrick Hopkins1

University of Virginia1,Oak Ridge National Laboratory2

Keywords

defects | radiation effects | scanning transmission electron microscopy (STEM)

Symposium Organizers

Liam Collins, Oak Ridge National Laboratory
Rajiv Giridharagopal, University of Washington
Philippe Leclere, University of Mons
Thuc-Quyen Nguyen, University of California, Santa Barbara

Symposium Support

Silver
Bruker
Digital Surf

Session Chairs

Liam Collins
Rajiv Giridharagopal
Philippe Leclere

In this Session