Defect State Characterization for p-Si-WS_2+δ Devices using Frequency-Scanned Deep Level Transient Spectroscopy

Dec 7, 2023
9:15am - 9:20am

EL09-virtual

Mohd Samim Reza¹,Anannya Mathur¹,Madhusudan Singh¹

Indian Institute of Technology Delhi¹

deep level transient spectroscopy (DLTS) | defects | Raman spectroscopy

Valerio Piazza, Ecole Polytechnique Federale de Lausanne

Frances Ross, Massachusetts Institute of Technology

Alessandro Surrente, Wroclaw University of Science and Technology

Hark Hoe Tan, Australian National University

Guru Naik

Junghyun Park

Alessandro Surrente

Defect State Characterization for p-Si-WS2+δ Devices using Frequency-Scanned Deep Level Transient Spectroscopy