Microscale Electronic Properties of Epitaxial Gallium Nitride Surface Defects

Nov 27, 2023
11:30am - 11:45am

Hynes, Level 2, Room 210

Andrew Winchester¹,Michael Mastro²,Travis Anderson²,Jennifer Hite²,Sujitra Pookpanratana¹

National Institute of Standards and Technology¹,U.S. Naval Research Laboratory²

defects | electronic structure | scanning probe microscopy (SPM)

Stephen Goodnick, Arizona State University

Robert Kaplar, Sandia National Laboratories

Martin Kuball, University of Bristol

Yoshinao Kumagai, Tokyo University of Agriculture and Technology

Silver
Taiyo Nippon Sanson

Jack Flicker

Robert Kaplar