In-Situ Diffraction-Based Characterization on the Topotactic Reduction of Nickelate Thin Films

Nov 30, 2023
4:00pm - 4:15pm

Sheraton, Second Floor, Republic A

Wenzheng Wei

Kidae Shin

Hawoong Hong

Robert Klie

Yingjie Yang

Charles Ahn

Wenzheng Wei¹,Kidae Shin¹,Hawoong Hong²,Yeongjae Shin¹,Robert Klie³,Arashdeep Thind³,Yingjie Yang³,Frederick Walker¹,Charles Ahn¹

Yale University¹,Argonne National Laboratory²,University of Illinois at Chicago³

perovskites | thin film | x-ray fluorescence

Olaf Borkiewicz, Argonne National Laboratory

Jingshan Du, Pacific Northwest National Laboratory

S. Eileen Seo, Arizona State University

Shuai Zhang, University of Washington

Bronze
Center for the Science of Synthesis Across Scales
Molecular Engineering & Sciences Institute

Goknur Cambaz Buke

Mohsin Qazi