Correlative SEM / AFM Microscopy - Combining Two High-Performance Methods for Nanoscale Measurements

Nov 30, 2023
11:15am - 11:30am

Sheraton, Third Floor, Commonwealth

Lukas Stuehn

Marion Wolff

Hajo Frerichs¹,Sebastian Seibert¹,Lukas Stuehn¹,Marion Wolff¹,Darshit Jangid¹,Christian Schwalb¹

Quantum Design Microscopy GmbH¹

scanning electron microscopy (SEM) | scanning probe microscopy (SPM)

Liam Collins, Oak Ridge National Laboratory

Rajiv Giridharagopal, University of Washington

Philippe Leclere, University of Mons

Thuc-Quyen Nguyen, University of California, Santa Barbara

Silver
Bruker
Digital Surf

Philippe Leclere

Stefan Weber