November 26 - December 1, 2023
Boston, Massachusetts
Symposium Supporters
2023 MRS Fall Meeting
CH01.08.38

Characterization of Beam Sensitive Samples Through Dose Fractionated Spectrum Imaging

When and Where

Nov 28, 2023
8:00pm - 10:00pm
Hynes, Level 1, Hall A

Presenter(s)

Co-Author(s)

Andrew Thron1,Liam Spillane1,Ray Twesten1,Robert Colby2

Gatan Inc.1,ExxonMobil Technology and Engineering Company2

Keywords

electron energy loss spectroscopy (EELS) | scanning transmission electron microscopy (STEM) | transmission electron microscopy (TEM)

Symposium Organizers

Liam Collins, Oak Ridge National Laboratory
Rajiv Giridharagopal, University of Washington
Philippe Leclere, University of Mons
Thuc-Quyen Nguyen, University of California, Santa Barbara

Symposium Support

Silver
Bruker
Digital Surf

Session Chairs

Liam Collins
Rajiv Giridharagopal
Philippe Leclere

In this Session