Reduction of Lattice Mismatch Induced Strain and Critical Thickness Identification for Long-Range Crystallinity Niobium Nitride on 6H-SiC for High Quality SNSPD Detectors

Dec 1, 2023
2:30pm - 2:45pm

Hynes, Level 2, Room 210

Patrick Shea

Annaliese Drechsler^1,2,Patrick Shea²,Aristos Christou¹

University of Maryland¹,Northrop Grumman Corporation²

interface | physical vapor deposition (PVD)

Stephen Goodnick, Arizona State University

Robert Kaplar, Sandia National Laboratories

Martin Kuball, University of Bristol

Yoshinao Kumagai, Tokyo University of Agriculture and Technology

Silver
Taiyo Nippon Sanson

Robert Kaplar

Shashwat Rathkanthiwar