May 8 - 13, 2022
Honolulu, Hawaii
May 23 - 25, 2022 (Virtual)
2022 MRS Spring Meeting
SF07.06.02
STEM-Based Techniques to Characterize Nano-Scale Defects Under Coupled Irradiation and Temperature
When and Where
May 10, 2022
2:15pm - 2:30pm
2:15pm - 2:30pm
Hilton, Kalia Conference Center, 2nd Floor, Kahili 2
Presenter(s)
Co-Author(s)
Sean Mills1,2,Alex Lin2,Peter Ercius2,Andrew Minor1,2
University of California, Berkeley1,Lawrence Berkeley National Laboratory2
Keywords
defects | scanning transmission electron microscopy (STEM)
Symposium Organizers
Session Chairs
Cody Dennett
Khalid Hattar