May 8 - 13, 2022
Honolulu, Hawaii
May 23 - 25, 2022 (Virtual)
2022 MRS Spring Meeting
CH03.12.01
Automated Defect Detection in Electron Microscopy of Radiation Damage in Metals
When and Where
May 12, 2022
10:30am - 11:00am
10:30am - 11:00am
Hawai'i Convention Center, Level 4, Ballroom C
Presenter(s)
Co-Author(s)
Dane Morgan1,Ryan Jacobs1,Priyam Patki2,Matthew Lynch2,Kevin Field2
University of Wisconsin--Madison1,University of Michigan–Ann Arbor2
Keywords
scanning transmission electron microscopy (STEM) | transmission electron microscopy (TEM)
Symposium Organizers
Leopoldo Molina-Luna, Darmstadt University of Technology
Ursel Bangert, University of Limerick
Martial Duchamp, Nanyang Technological Universisty
Andrew Minor, University of California, Berkeley
Symposium Support
Bronze
DENSsolutions BV
MRS-Singapore
Quantum Detectors Ltd
DENSsolutions BV
MRS-Singapore
Quantum Detectors Ltd
Session Chairs
Ursel Bangert
Colin Ophus