May 8 - 13, 2022
Honolulu, Hawaii
May 23 - 25, 2022 (Virtual)
2022 MRS Spring Meeting
CH01.14.04

(2+1) D Temperature Mapping of Stacked Silicon Dies from X-Ray Diffraction Intensities

When and Where

May 23, 2022
1:30pm - 1:45pm
CH01-Virtual

Presenter(s)

Co-Author(s)

Darshan Chalise1,David Cahill1

University of Illinois - Urbana Champaign1

Keywords

x-ray diffraction (XRD)

Symposium Organizers

Wenpei Gao, North Carolina State University
Arnaud Demortiere, Universite de Picardie Jules Verne
Madeline Dukes, Protochips, Inc.
Yuzi Liu, Argonne National Laboratory

Symposium Support

Silver
Protochips

Session Chairs

Arnaud Demortiere
Madeline Dukes
Wenpei Gao
Yuzi Liu

In this Session