May 8 - 13, 2022
Honolulu, Hawaii
May 23 - 25, 2022 (Virtual)
2022 MRS Spring Meeting
EQ08.07.01
Vacancy-Related Defect Characterization in Optoelectronic Ge/Ge-Sn Core/Shell Nanowires via Correlated Extended X-Ray Absorption Fine Structure Spectroscopy (EXAFS) and Single Wire Electrical Measurements
When and Where
May 10, 2022
1:30pm - 1:45pm
1:30pm - 1:45pm
Hawai'i Convention Center, Level 3, 317A
Presenter(s)
Co-Author(s)
Paul McIntyre1,2,John Lentz1,Aein Babadi1,Apurva Mehta2,Ryan Davis2
Stanford University1,SLAC National Accelerator Laboratory2
Keywords
defects | extended x-ray absorption fine structure (EXAFS)
Symposium Organizers
Byungha Shin, Korea Advanced Institute of Science and Technology
Robert Hoye, Imperial College London
Shinae Jun, Samsung Advanced Institute of Technology
Laura Schelhas, National Renewable Energy Laboratory
Session Chairs
Robert Hoye
David Munoz-Rojas