A Machine-Learning Approach to Characterization of Amorphous Materials with EELS-SI and 4D-STEM

May 9, 2022
5:00pm - 7:00pm

Hawai'i Convention Center, Level 1, Kamehameha Exhibit Hall 2 & 3

Jinseok Ryu

Sangmin Lee

Ingyu Yoo

Miyoung Kim, Seoul National University

Jinseok Ryu¹,Sangmin Lee¹,Ingyu Yoo¹,Miyoung Kim¹

Seoul National University¹

electron energy loss spectroscopy (EELS) | scanning transmission electron microscopy (STEM)

Leopoldo Molina-Luna, Darmstadt University of Technology

Ursel Bangert, University of Limerick

Martial Duchamp, Nanyang Technological Universisty

Andrew Minor, University of California, Berkeley

Bronze
DENSsolutions BV
MRS-Singapore
Quantum Detectors Ltd

Ursel Bangert

Martial Duchamp

Andrew Minor

Leopoldo Molina-Luna