Characterizing and Exploiting Topological and Point Defects in Ferroelectric Thin Films—Optimizing Electromechanical Response and Investigating Energy Landscapes with Automated Experiments

Dec 1, 2022
3:45pm - 4:15pm

Sheraton, 3rd Floor, Gardner A/B

Kyle Kelley

V. Sharma

J.C. Yang

Rama Vasudevan¹,Kyle Kelley¹,A. Borisevich¹,A.N. Morozvska²,V. Sharma³,J.C. Yang⁴,Panchapakesan Ganesh¹,Stephen Jesse¹,Sergei Kalinin³

Oak Ridge National Laboratory¹,National Academy of Sciences of Ukraine²,The University of Tennessee, Knoxville³,National Cheng Kung University⁴

Yuanyuan Zhou, Hong Kong Baptist University

Carmela Aruta, National Research Council

Panchapakesan Ganesh, Oak Ridge National Laboratory

Hua Zhou, Argonne National Laboratory

Rama Vasudevan

Yuanyuan Zhou