Using Four-Dimensional-Scanning Transmission Electron Microscopy (4D-STEM) for Large Field-of-View Material Property Measurements and Ptychographic Atomic-Resolution Tomography.

Nov 29, 2022
1:30pm - 2:00pm

Hynes, Level 1, Room 101

Colin Ophus

Colin Ophus¹

Lawrence Berkeley National Lab¹

combinatorial | nanoscale | scanning transmission electron microscopy (STEM)

Robert Klie, University of Illinois at Chicago

Miaofang Chi, Oak Ridge National Laboratory

Ryo Ishikawa, The University of Tokyo

Quentin Ramasse, SuperSTEM Laboratory

Bronze
Gatan
JEOL USA Inc.
Protochips Inc
Thermo Fisher Scientific

Robert Klie

Naoya Shibata