A System for Measuring Deep Ultraviolet Cathodoluminescence

Dec 2, 2022
9:45am - 10:00am

Hynes, Level 2, Room 202

Simo Pajovic

Steven Kooi

Ali Ghorashi

Yang Yu

Ido Kaminer

Simo Pajovic¹,Charles Roques-Carmes¹,Steven Kooi¹,Nicholas Rivera¹,Ali Ghorashi¹,Yang Yu²,Ido Kaminer³,Marin Soljačić¹

Massachusetts Institute of Technology¹,Raith America, Inc.²,Technion–Israel Institute of Technology³

luminescence | scanning electron microscopy (SEM)

Yu-Jung Lu, Academia Sinica

Artur Davoyan, University of California, Los Angeles

Ho Wai Howard Lee, University of California, Irvine

David Norris, ETH Zürich

Gold
Enli Technology Co., Ltd.

Bronze
ACS Photonics
De Gruyter
Taiwan Semiconductor Manufacturing Company

Viktoriia Babicheva

Yu-Jung Lu