Quantitative Elemental Analysis of Silicon Thin-Film Anodes with 100-nm Depth Resolution

Nov 29, 2022
2:30pm - 2:45pm

Hynes, Level 1, Room 103

Xiaoyang Ji

Nathan Fritz

Paul Braun

David Cahill

Xiaoyang Ji¹,Nathan Fritz¹,Paul Braun¹,David Cahill¹

University of Illinois at Urbana-Champaign¹

chemical composition | Rutherford Backscattering (RBS)

Peng Bai, Washington University in St. Louis

Donal Finegan, National Renewable Energy Laboratory

Hui Xiong, Boise State University

Yuan Yang, Columbia University

Silver
Carl Zeiss Microscopy

Kent Griffith

Hui Xiong