Late News: Electronic Excitations of α-Fe2O3Thin Films Measured by Resonant Inelastic X-Ray Scattering at the Fe LIII-Edge—Momentum, Temperature and Dopant Dependence

David Ellis

Ru-Pan Wang

Deniz Wong

Jason Cooper

Christian Schulz

Yi-De Chuang

Yifat Piekner

Daniel Grave

Markus Schleuning

Dennis Friedrich

Frank de Groot

Roel Van de Krol

Avner Rothschild

David Ellis¹,Ru-Pan Wang^2,3,Deniz Wong⁴,Jason Cooper⁵,Christian Schulz⁴,Yi-De Chuang⁵,Yifat Piekner¹,Daniel Grave^1,6,Markus Schleuning⁷,Dennis Friedrich⁷,Frank de Groot⁸,Roel Van de Krol⁷,Avner Rothschild¹

Technion–Israel Institute of Technology¹,University of Hamburg²,Deutsches Elektronen-Synchrotron DESY³,Helmholtz-Zentrum Berlin für Materialen und Energie⁴,Lawrence Berkeley National Laboratory⁵,Ben-Gurion University of the Negev⁶,Helmholtz-Zentrum Berlin für Materialien und Energie GmbH⁷,Debye Institute, Utrecht University⁸