April 17 - 23, 2021
April 17 - 23, 2021 (Virtual)
2021 MRS Spring Meeting
NM08.11.03
Artefacts in Scanning Thermal Microscopy—Nanometre-Scale Roughness and Oxide Films Down to Native Thickness
When and Where
Apr 20, 2021
8:40am - 8:55am
8:40am - 8:55am
NM08
Presenter(s)
Co-Author(s)
Severine Gomes1,Eloise Guen1,Pierre-Olivier Chapuis1,NJ Kaur2,Petr Klapetek2,Ravish Rajkumar3,Gordon Mills3,Philipp Dobson4,Jonathan Weaver4
CNRS-CETHIL1,CMI2,Kelvin NanoTechnology3,University of Glasgow4
Keywords
nanoscale | scanning probe microscopy (SPM) | thermal conductivity
Symposium Organizers
Martin Maldovan, Georgia Inst of Technology
Sangyeop Lee, University of Pittsburgh
Kedar Hippalgaonkar, Nanyang Technological University
Konstantinos Termentzidis, Université de Lyon
Session Chairs
Martin Maldovan
Konstantinos Termentzidis