April 17 - 23, 2021
April 17 - 23, 2021 (Virtual)
2021 MRS Spring Meeting
CT03.05.07

Structural Analysis of Dot-Core GaN Substrates Using X-Ray Topography

When and Where

Apr 20, 2021
9:55am - 10:00am
CT03

Presenter(s)

Co-Author(s)

Michael Liao1,Yekan Wang1,Kenny Huynh1,Mark Goorsky1

University of California, Los Angeles1

Keywords

dislocations | nitride | x-ray diffraction (XRD)

Symposium Organizers

Olivier Thomas, Aix Marseille Universite
Arief Budiman, BINUS University
Margaret Murnane, University of Colorado Boulder
Ehrenfried Zschech, Fraunhofer IKTS

Session Chairs

Olivier Thomas
Ehrenfried Zschech

In this Session