Dynamic Surface Structure of Cu Thin-Film Electrode Under CO₂ Reduction Conditions from In Situ X-Ray Characterization

Apr 21, 2021
12:25pm - 12:30pm

EN02

Soohong Lee

John Lin

Apurva Mehta

Ryan Davis

Soohong Lee¹,John Lin^2,3,Apurva Mehta³,Ryan Davis³,Thomas Jaramillo^2,3,Christopher Hahn³,Walter Drisdell¹

Lawrence Berkeley National Laboratory¹,Stanford University²,SLAC National Accelerator Laboratory³

Cu | interface | x-ray diffraction (XRD)

Fatwa Abdi, Helmholtz-Zentrum Berlin

Simelys Hernandez, Politecnico di Torino

Yun Hao Ng, City University of Hong Kong

Francesca Maria Toma, Lawrence Berkeley National Laboratory

Silver
Helmholtz-Zentrum Berlin

Fatwa Abdi

Francesca Maria Toma

Dynamic Surface Structure of Cu Thin-Film Electrode Under CO2 Reduction Conditions from In Situ X-Ray Characterization