April 17 - 23, 2021
April 17 - 23, 2021 (Virtual)
2021 MRS Spring Meeting
CT03.04.06

Advanced Material Characterization Using Quantitative Full-Field X-Ray Nano-Imaging

When and Where

Apr 19, 2021
5:20pm - 5:35pm
CT03

Presenter(s)

Co-Author(s)

Mingyuan Ge1,Jiayong Zhang1,Xianghui Xiao1,Lee Wah-Keat1

Brookhaven National Laboratory1

Keywords

metrology | nanostructure

Symposium Organizers

Olivier Thomas, Aix Marseille Universite
Arief Budiman, BINUS University
Margaret Murnane, University of Colorado Boulder
Ehrenfried Zschech, Fraunhofer IKTS

Session Chairs

Arief Budiman
Margaret Murnane
Olivier Thomas

In this Session