X-Ray Diffraction Studies of GaN p-i-n Structures for High Power Electronics

Apr 19, 2021
12:10pm - 12:25pm

EL04

Jiaheng He

Fabian Naab

Mohsen Nami

Bingjun Li

Jung Han

Alexandra Zimmerman¹,Jiaheng He¹,Guanjie Cheng¹,Davide del Gaudio¹,Jordan Occena¹,Fabian Naab¹,Mohsen Nami²,Bingjun Li²,Jung Han²,Rachel Goldman¹

University of Michigan–Ann Arbor¹,Yale University²

III-V | interface | x-ray diffraction (XRD)

Hongping Zhao, The Ohio State University

Masataka Higashiwaki, National Institute of Information & Comm Tech

Robert Kaplar, Sandia National Laboratories

Julien Pernot, University of Grenoble

Silver
Taiyo Nippon Sanso

Srabanti Chowdhury

Robert Kaplar