Quantifying Nano-Electromechanical and Nano-Mechanical Measurements with a Metrological Atomic Force Microscope

Nov 30, 2021
10:30am - 11:00am

Hynes, Level 3, Room 301

Roger Proksch¹

Asylum Research and Oxford Instruments¹

scanning probe microscopy (SPM)

Philippe Leclere, University of Mons

Zoya Leonenko, University of Waterloo

Ken Nakajima, Tokyo Institute of Technology

Igor Sokolov, Tufts University

Gold
Bruker

Silver
Oxford Instruments, Asylum Research

Bronze
Nanosurf

Udo Schwarz

Igor Sokolov