Atomically Resolved Imaging of Electronic Defects in a CVD Grown Transition Metal Carbide: α–Mo₂C

Dec 2, 2021
11:15am - 11:30am

Hynes, Level 2, Room 204

Omer Caylan

Goknur Buke

Saima Sumaiya¹,Omer Caylan²,Goknur Buke²,Mehmet Baykara¹

University of California, Merced¹,TOBB University of Economics and Technology²

2D materials | defects | scanning probe microscopy (SPM)

Feng He, Harbin Institute of Technology

SungWoo Nam, University of California, Irvine

Michael Pettes, Los Alamos National Laboratory

Qing Tu, Texas A&M University

Silver
National Science Foundation

Michael Pettes

Qing Tu

Atomically Resolved Imaging of Electronic Defects in a CVD Grown Transition Metal Carbide: α–Mo2C