April 22 - 26, 2019
Phoenix, Arizona
2019 MRS Spring Meeting
CP01.02.04

Nanoscale Dielectric Charging and Breakdown Mapping

When and Where

Apr 23, 2019
2:45pm - 3:00pm
PCC West, 100 Level, Room 101 A

Presenter(s)

Bryan Huey, University of Connecticut

Co-Author(s)

Bryan Huey1,Thomas Moran1,James Steffes1,Keigo Suzuki2

University of Connecticut1,Murata Manufacturing Co., Ltd.2

Keywords

scanning probe microscopy (SPM)

Symposium Organizers

Jessica Krogstad, University of Illinois at Urbana-Champaign
Nan Li, Los Alamos National Laboratory
Nobumichi Tamura, Lawrence Berkeley National Laboratory
Arief Budiman, Singapore University of Technology and Design

Session Chairs

Arief Budiman
Young-Chang Joo

In this Session