April 22 - 26, 2019
Phoenix, Arizona
2019 MRS Spring Meeting
QN03.10.24
Sub-Surface Imaging of Atomically-Thin Semiconductors Beneath Dielectrics Based on Optical Standing Wave Using Photoemission Electron Microscopy with Deep-Ultraviolet Photoexcitation
When and Where
Apr 24, 2019
5:00pm - 7:00pm
5:00pm - 7:00pm
PCC North, 300 Level, Exhibit Hall C-E
Presenter(s)
Co-Author(s)
Taisuke Ohta1,Morgann Berg1,Fangze Liu2,Sean Smith1,Robert Copeland1,Calvin Chan1,Aditya Mohite3,Thomas Beechem1
Sandia National Laboratories1,Los Alamos National Laboratory2,Rice University3
Keywords
2D materials | metrology
Symposium Organizers
Deep Jariwala, University of Pennsylvania
Victor Brar, University of Wisconsin–Madison
SungWoo Nam, University of Illinois at Urbana-Champaign
Ursula Wurstbauer, Technical University of Munich
Symposium Support
Accurion Inc.
attocube systems AG
MilliporeSigma
CreaTec GmbH, represented by Sentys Inc.
attocube systems AG
MilliporeSigma
CreaTec GmbH, represented by Sentys Inc.
Session Chairs
Victor Brar
Deep Jariwala
SungWoo Nam
Ursula Wurstbauer