April 22 - 26, 2019
Phoenix, Arizona
2019 MRS Spring Meeting
QN05.13.05

Nanothermometry and Nanocharacterization in Scanning Thermal Microscopy—Approach Curves and Temperature Jumps at Contact

When and Where

Apr 25, 2019
2:45pm - 3:00pm
PCC North, 100 Level, Room 124 B

Presenter(s)

Co-Author(s)

Pierre-Olivier Chapuis1,Ali Alkurdi1,Axel Pic1,2,Eloise Guen1,Antonin Massoud1,Wenyu Zhao1,Jan Martinek3,Christophe Lucchesi1,Rodolphe Vaillon1,4,Sebastien Gallois-Garreignot2,Matthieu Bugnet1,Petr Klapetek3,Jean-Marie Bluet1,Séverine Gomès1

CNRS - INSA Lyon1,ST Microelectronics2,CMI3,IES4

Keywords

metrology | thermal conductivity

Symposium Organizers

Yongjie Hu, University of California, Los Angeles
Yee Kan Koh, National University of Singapore
Lucas Lindsay, Oak Ridge National Laboratory
Amy Marconnet, Purdue University

Session Chairs

Yongjie Hu

In this Session