April 22 - 26, 2019
Phoenix, Arizona
2019 MRS Spring Meeting
CP03.04.07

Dopant Profiling Using Low-Voltage SEM for GaN Power Electronics

When and Where

Apr 23, 2019
5:00pm - 7:00pm
PCC North, 300 Level, Exhibit Hall C-E

Presenter(s)

Co-Author(s)

Shanthan Reddy Alugubelli1,Houqiang Fu1,Kai Fu1,Hanxiao Liu1,Yuji Zhao1,Fernando Ponce1

Arizona State University1

Keywords

nitride | scanning electron microscopy (SEM)

Symposium Organizers

Chengjun Sun, Argonne National Laboratory
Jenny Lockard, Rutgers, The State University of New Jersey
Feng Wang, Brookhaven National Laboratory
Markus Winterer, University of Duisburg-Essen

Symposium Support

Rutgers University - Newark Chancellor's Office
Rutgers University - Newark Department of Chemistry
The Advanced Photon Source (APS) at Argonne National Laboratory

Session Chairs

Jenny Lockard
Chengjun Sun
Feng Wang
Markus Winterer

In this Session