April 22 - 26, 2019
Phoenix, Arizona
2019 MRS Spring Meeting
QN02.09.06
Direct Picometer-Scale Characterization of Dopants and Defect Structures in 2D Materials Using Electron Pychography
When and Where
Apr 25, 2019
9:30am - 10:00am
9:30am - 10:00am
PCC North, 100 Level, Room 128 B
Presenter(s)
Co-Author(s)
David Muller1
Cornell University1
Keywords
2D materials | interatomic arrangements | scanning transmission electron microscopy (STEM)
Symposium Organizers
Srinivasa Rao Singamaneni, The University of Texas at El Paso
Nasim Alem, The Pennsylvania State University
Jian-Hao Chen, Peking University
Oleg Yazyev, Ecole Polytechnique Federale de Lausanne, Switzerland
Symposium Support
Army Research Office
National Science Foundation
Radiant Technologies
National Science Foundation
Radiant Technologies
Session Chairs
Yujun Deng
Danielle Hickey
Srinivasa Rao Singamaneni
Andre Stesmans