April 22 - 26, 2019
Phoenix, Arizona
2019 MRS Spring Meeting
CP03.04.11
In Situ Electron Beam Induced Current STEM Measurements of the Minority Carrier Diffusion Length in n-GaN
When and Where
Apr 23, 2019
5:00pm - 7:00pm
5:00pm - 7:00pm
PCC North, 300 Level, Exhibit Hall C-E
Presenter(s)
Co-Author(s)
Zoey Warecki1,Andrew Armstrong2,Alec Talin2,John Cumings1
University of Maryland1,Sandia National Laboratories2
Keywords
electrical properties | interface | scanning transmission electron microscopy (STEM)
Symposium Organizers
Chengjun Sun, Argonne National Laboratory
Jenny Lockard, Rutgers, The State University of New Jersey
Feng Wang, Brookhaven National Laboratory
Markus Winterer, University of Duisburg-Essen
Symposium Support
Rutgers University - Newark Chancellor's Office
Rutgers University - Newark Department of Chemistry
The Advanced Photon Source (APS) at Argonne National Laboratory
Rutgers University - Newark Department of Chemistry
The Advanced Photon Source (APS) at Argonne National Laboratory
Session Chairs
Jenny Lockard
Chengjun Sun
Feng Wang
Markus Winterer