Jonatan Holmér1,Lunjie Zeng1,Thomas Nordqvist2,Peter Krogstrup2,Jesper Nygård2,Ludvig de Knoop1,Eva Olsson1
Chalmers University of Technology1,University of Copenhagen2
Keywords
in situ
| scanning electron microscopy (SEM)
Symposium Organizers
Chengjun Sun, Argonne National Laboratory
Jenny Lockard, Rutgers, The State University of New Jersey
Feng Wang, Brookhaven National Laboratory
Markus Winterer, University of Duisburg-Essen
Symposium Support
Rutgers University - Newark Chancellor's Office Rutgers University - Newark Department of Chemistry The Advanced Photon Source (APS) at Argonne National Laboratory