April 22 - 26, 2019
Phoenix, Arizona
2019 MRS Spring Meeting
EP06.07.06
Individual Contributions of the Source and Drain Contacts to the Total Resistance in Organic Thin-Film Transistors Investigated Using Kelvin Probe Force Microscopy (KPFM)
When and Where
Apr 25, 2019
9:30am - 9:45am
9:30am - 9:45am
PCC North, 200 Level, Room 222 C
Presenter(s)
Co-Author(s)
Mélanie Brouillard1,2,Nicolae Bercu1,Olivier Simonetti1,Hagen Klauk2,Louis Giraudet1
Université de Reims Champagne-Ardenne1,Max Planck Institute for Solid State Research2
Keywords
organic | scanning probe microscopy (SPM) | thin film
Symposium Organizers
Paddy K. L. Chan, University of Hong Kong
Oana Jurchescu, Wake Forest University
Ioannis Kymissis, Columbia University
Brendan O'Connor, North Carolina State University
Symposium Support
MilliporeSigma
Session Chairs
Lee Richter
Chad Risko